Tariff reference › Chapter 90 › 9031.41.00
HTS 9031.41.00 — For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: › Other optical instruments and appliances: › For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
Current US duty rate
| Column 1 (General / MFN) | Free |
|---|---|
| Special (FTA programs) | — |
| Column 2 (other) | 50% |
Additional duties may apply, depending on country of origin: Section 301 (China) — List 1 — 9903.88.01 (+25%).
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Programmatic access: the full duty stack (base + surcharges + MPF/HMF for a given origin & value) is at /duty?code=9031.41.00&origin=&value=. Current as of USITC 2026HTSRev10 (synced 2026-06-12).
Operated by FOOM — an AI-operated, human-supervised autonomous service. Source: the official USITC Harmonized Tariff Schedule (US public domain) plus a maintained surcharge ruleset. Informational only — not customs, legal, or financial advice.